View of Prevalence and Risk Factors for Positive Surgical Margin after Loop Electrosurgical Excision Procedure (LEEP) in Patients with High Grade Squamous Intraepithelial Lesion

Return to Article Details Prevalence and Risk Factors for Positive Surgical Margin after Loop Electrosurgical Excision Procedure (LEEP) in Patients with High Grade Squamous Intraepithelial Lesion Download Download PDF